When checking and verifying capacitors, inductors, diodes, bipolar transistors, and cables, the gamut of test methods can range from those used to confirm a defective component to identifying the ...
WEST LAFAYETTE, Ind. – Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use ...
A new method to fit together layers of semiconductors as thin as a few nanometers has resulted in not only a scientific discovery but also a new type of transistor for high-power electronic devices. A ...
Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use to save tens of ...
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