EDN

A simpler circuit for characterizing JFETs

Combining Cor Van Rij's JFET test socket with two DMMs, a current limiter, switches and a wall wart yield a simple, accurate ...
EDN

Inside the battery: A quick look at internal resistance

A quick calculation: To estimate a battery’s internal resistance, you can use a simple voltage-drop method when the ...
Semiconductor Engineering

The Thermal Trap: How Dielectrics Limit Device Performance

This coupling heavily influences performance and yield. Heat induces mechanical deformation, deformation alters carrier ...
Hosted on MSN

IND vs SA 1st Test: Eden Gardens braces up for Test match action after six years

Eden Gardens. The theatre of dreams. A hallowed ground where nothing is impossible and impossible is nothing. Where VVS Laxman and Rahul Dravid and Harbhajan Singh ripped the formbook to shreds in ...
Hosted on MSN

Kochadhaman Election Result 2025 LIVE: Tough Contest Among Candidates Check Latest Trends in Bihar's Kochadhaman

Kochadhaman Election Result 2025 LIVE: The Kochadhaman Assembly constituency is one of the 243 seats in Bihar. It falls in the Kishanganj district. Like every election, the contest on this seat is ...
IEEE

A Hybrid Fault Diagnosis Framework Based on Test Stimulus Optimization and MPCNN for Analog Circuits

Abstract: Hybrid fault diagnosis in analog circuits remains a challenging task, particularly due to the overlapping characteristics of different component faults, which often degrade the ...
IEEE

Equivalent Circuit Model for Simulating ESD Discharge Current in ESD Damage Test

Abstract: Electrostatic discharge (ESD) damage evaluation methods for common mode choke (CMC) and ESD suppression devices are standardized in IEC 62228-5 Annex E and Annex F, respectively. The ...