One of the most basic tools for tinkering with electronics is a multimeter. Today, even a cheap meter has capabilities that would have been either very expensive or unobtainable back in the 1970s.

A steady stream of advances has elevated test and measurement instruments to the point where they can reveal minute details of signals with lightning-quick rise and fall times. So, then, what about ...

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

[Piffpaffpoltrie] had a problem. They found the InLine VA40R to be a perfectly usable multimeter, except for a couple of flaws. Most glaring among these were the tiny sockets for the test probes.

October 9, 2014. Everett Charles Technologies (ECT) has launched the Z0 and Z1 probes—two new members of the ZIP probe family designed to meet signal-integrity challenges driven by the ever increasing ...

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...