In a highly competitive market, a plastic parts company leveraged Lean Six Sigma methodologies, particularly Process ...

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...

Manufacturing quality evaluation is a critical discipline that focuses on assessing a process’s ability to produce outputs within pre‐defined tolerance limits. Recent advances combine traditional ...

“Root Cause Analysis (RCA) is a critical technology for yield improvement in integrated circuit manufacture. Traditional RCA prefers unsupervised algorithms such as Expectation Maximization based on ...

Designing for yield is an afterthought in today's design flows, whether it is digital, analog/RF or mixed-signal. The lack of design for yield tools has forced the digital world to accept overly ...