In the LED, semi-conductor, automotive and medical sectors, surface metrology and characterization is an important criterion to ensure product performance in a wide range of applications. These ...
In response to the growing number of applications for electromechanical imaging and spectroscopy, Asylum Research offers the Piezo Force Module, which enables very-high-sensitivity, high-bias, and ...
A Photoconductive Atomic Force Microscopy (pcAFM) module is now available for the Bruker Dimension Icon platform. The module enables sample illumination while performing nanoscale electrical ...
The high-resolution imaging capability of atomic force microscopy (AFM) can be extended to enable a wide range of characterization methods to study electrical, mechanical, thermal, and other ...
(Nanowerk Application Note) Surface metrology and characterization is ever more critical for overall product performance in wide ranging applications across the semi-conductor, LED, data storage, ...
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